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The third generation of aging test - PD trap device/PD idu function -- the key shift

Time:12-06



Third generation test aging decoy unit function description:
1, when the decoy is inserted into the products tested, automatically measured product output rose to the highest voltage value;
2, on the products of the highest voltage being measured, light touch switch, products tested output voltage will change, at a time from one of the highest voltage to a low voltage change, to the lowest voltage, a gear to high voltage change, so cycle;
3 and power input termination some meter circuits, when the products are being measured output power is negative after the failure, this lure device does not work, prevent the polarity against the possibility of burning machine;
4, on two feet CC and two zener diode, when the products tested in CC feet with positive or negative short circuit, this product will not burn out;
5, after the third generation of product optimization, a product is the perfect combination of utility function, can test the product already, also can aging products, a multi-purpose products, solve the PD testing aging in the production and management, guarantee the quality of the products is the tool,


Shenzhen Ming and technology co., LTD., focusing on research and development and scheme of power management chip,
We bring to you is not only a price advantage, but also the future product reliability assurance!

Business is responsible for: Mr. Huang, QQ: 3341254367
Tel: (13434351036 + V letter with)
The company's web site: www.led-ics.com
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